BibTeX record conf/iecon/WuSIWB14

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@inproceedings{DBLP:conf/iecon/WuSIWB14,
  author       = {Rui Wu and
                  Liudmila Smirnova and
                  Francesco Iannuzzo and
                  Huai Wang and
                  Frede Blaabjerg},
  title        = {Investigation on the short-circuit behavior of an aged {IGBT} module
                  through a 6 kA/1.1 kV non-destructive testing equipment},
  booktitle    = {{IECON} 2014 - 40th Annual Conference of the {IEEE} Industrial Electronics
                  Society, Dallas, TX, USA, October 29 - November 1, 2014},
  pages        = {3367--3373},
  publisher    = {{IEEE}},
  year         = {2014},
  url          = {https://doi.org/10.1109/IECON.2014.7048996},
  doi          = {10.1109/IECON.2014.7048996},
  timestamp    = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl       = {https://dblp.org/rec/conf/iecon/WuSIWB14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}