"Impact of Duty Factor, Stress Stimuli, and Gate Drive Strength on Gate ..."

Halil Kukner et al. (2012)

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DOI: 10.1109/DSD.2012.77

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Halil Kukner, Pieter Weckx, Praveen Raghavan, Ben Kaczer, Francky Catthoor, Liesbet Van der Perre, Rudy Lauwereins, Guido Groeseneken:
Impact of Duty Factor, Stress Stimuli, and Gate Drive Strength on Gate Delay Degradation with an Atomistic Trap-Based BTI Model. DSD 2012: 1-7

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