"Impact of Accelerated Life Testing on the Metrological Performance of ..."

Marco Carratù et al. (2025)

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DOI: 10.1109/I2MTC62753.2025.11079002

access: closed

type: Conference or Workshop Paper

metadata version: 2025-09-06

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Marco Carratù, Vincenzo Gallo, Valter Laino, Paolo Sommella, Antonio Pietrosanto, Lorenzo Ciani, Roberto Singuaroli, Gabriele Patrizi:
Impact of Accelerated Life Testing on the Metrological Performance of Commercial MEMS Accelerometers. I2MTC 2025: 1-6

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