High Sensitive ECT Probe for Detection of Deeply Buried Defects - Lian Xie; Prashanth Baskaran; Artur Lopes Ribeiro; Francisco C. Alegria; Bo Feng; Helena Maria Geirinhas Ramos (IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2025, Chemnitz, Germany, May 19-22, 2025, 2025)