"Fault Diagnosis for Analog Circuits by Using EEMD, Relative Entropy, and ELM."

Jian Xiong, Shulin Tian, Chenglin Yang (2016)

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DOI: 10.1155/2016/7657054

access: open

type: Journal Article

metadata version: 2020-03-12

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Jian Xiong, Shulin Tian, Chenglin Yang:
Fault Diagnosis for Analog Circuits by Using EEMD, Relative Entropy, and ELM. Comput. Intell. Neurosci. 2016: 7657054:1-7657054:9 (2016)

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