BibTeX record journals/integration/NoltsisMRCS19

• > Home > journals/integration/NoltsisMRCS19

@article{DBLP:journals/integration/NoltsisMRCS19,
  author       = {Michail Noltsis and
                  Eleni Maragkoudaki and
                  Dimitrios Rodopoulos and
                  Francky Catthoor and
                  Dimitrios Soudris},
  title        = {Failure probability of a FinFET-based {SRAM} cell utilizing the most
                  probable failure point},
  journal      = {Integr.},
  volume       = {69},
  pages        = {111--119},
  year         = {2019},
  url          = {https://doi.org/10.1016/j.vlsi.2018.03.016},
  doi          = {10.1016/J.VLSI.2018.03.016},
  timestamp    = {Thu, 20 Feb 2020 13:21:53 +0100},
  biburl       = {https://dblp.org/rec/journals/integration/NoltsisMRCS19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}