"Hardened latch designs based on the characteristic of transistor for ..."

Hui Xu et al. (2024)

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DOI: 10.1016/J.MEJO.2023.106031

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type: Journal Article

metadata version: 2024-08-04

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Hui Xu, Chaoming Liu, Ruijun Ma, Tai Song, Zhengfeng Huang, Jun Wang, Xuewei Qin, Yu Xia:
Hardened latch designs based on the characteristic of transistor for mitigating multiple-node-upsets in harsh radiation environments. Microelectron. J. 143: 106031 (2024)

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