"An unknown wafer surface defect detection approach based on Incremental ..."

Zeyun Zhao et al. (2024)

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DOI: 10.1016/J.RESS.2024.109966

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type: Journal Article

metadata version: 2025-01-19

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Zeyun Zhao, Jia Wang, Qian Tao, Andong Li, Yiyang Chen:
An unknown wafer surface defect detection approach based on Incremental Learning for reliability analysis. Reliab. Eng. Syst. Saf. 244: 109966 (2024)

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