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ORCIDChristian Sauer 0001
- > Home > Persons > Christian Sauer 0001
Publications
- 2021
[i4]Ahmet Cagri Bagbaba, Maksim Jenihhin, Raimund Ubar, Christian Sauer:
Representing Gate-Level SET Faults by Multiple SEU Faults at RTL. CoRR abs/2103.05106 (2021)- 2020
- [c31]Maksim Jenihhin, Said Hamdioui, Matteo Sonza Reorda
, Milos Krstic, Peter Langendörfer, Christian Sauer, Anton Klotz, Michael Hübner, Jörg Nolte, Heinrich Theodor Vierhaus, Georgios N. Selimis, Dan Alexandrescu, Mottaqiallah Taouil, Geert Jan Schrijen, Jaan Raik, Luca Sterpone, Giovanni Squillero, Zoya Dyka:
RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems. DATE 2020: 388-393 - [c29]Ahmet Cagri Bagbaba, Maksim Jenihhin, Raimund Ubar, Christian Sauer:
Representing Gate-Level SET Faults by Multiple SEU Faults at RTL. IOLTS 2020: 1-6 - [c28]Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Annachiara Ruospo, Riccardo Mariani, Ghani Kanawati, Ernesto Sánchez, Matteo Sonza Reorda, Maksim Jenihhin, Said Hamdioui, Christian Sauer:
Special Session: AutoSoC - A Suite of Open-Source Automotive SoC Benchmarks. VTS 2020: 1-9 - [i3]Ahmet Cagri Bagbaba, Maksim Jenihhin, Jaan Raik, Christian Sauer:
Accelerating Transient Fault Injection Campaigns by using Dynamic HDL Slicing. CoRR abs/2001.09982 (2020) - [i2]Ahmet Cagri Bagbaba, Maksim Jenihhin, Jaan Raik, Christian Sauer:
Efficient Fault Injection based on Dynamic HDL Slicing Technique. CoRR abs/2002.00787 (2020) - 2019
- [c25]Ahmet Cagri Bagbaba, Maksim Jenihhin, Jaan Raik, Christian Sauer:
Efficient Fault Injection based on Dynamic HDL Slicing Technique. IOLTS 2019: 52-53 - [c23]Ahmet Cagri Bagbaba, Maksim Jenihhin, Jaan Raik, Christian Sauer:
Accelerating Transient Fault Injection Campaigns by using Dynamic HDL Slicing. NORCAS 2019: 1-7 - [i1]Maksim Jenihhin, Said Hamdioui, Matteo Sonza Reorda, Milos Krstic, Peter Langendörfer, Christian Sauer, Anton Klotz, Michael Hübner, Jörg Nolte, Heinrich Theodor Vierhaus, Georgios N. Selimis, Dan Alexandrescu, Mottaqiallah Taouil, Geert Jan Schrijen, Jaan Raik, Luca Sterpone, Giovanni Squillero, Zoya Dyka:
RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems. CoRR abs/1912.01561 (2019)
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