1© KEMET Electronics. All Rights Reserved.
Hi-Rel KO-CAP®
2© KEMET Electronics. All Rights Reserved.
Summarising Technology Innovations for Hi-Rel SMD Polymer
Tantalum Capacitors
Cristina Mota-Caetano
25th October 2017
Bremen Germany
BOOTH #H90
ec.kemet.com/polymer-spacetech2017
3© KEMET Electronics. All Rights Reserved.
27
Manufacturing	
Plants*
15,000
Employees*
44	billion
Components	
Shipped	per	year*
Ship	to	
97
Countries
Founded	
1919
$ $1.1B*
* Includes TOKIN
4© KEMET Electronics. All Rights Reserved.
Outline
• 15 Years Expanding Portfolio & Market Adoption
• High Reliability Focus: From Terrestrial to Space
• Technology Innovations Summary
• RoadMap
• Q&A
5© KEMET Electronics. All Rights Reserved.
2000 2015
Polymer
(Growth Phase)
MnO2
(Declining Phase)
Consumer
Enterprise
Telecomm
Military/Aero
Space
Automotive
Sales
Industrial
Dot-com
Bubble
Polymer
MnO2
Time
1999
Release
1987
Release
Intersection
Point (2015)
Medical
J. Young, “Last decade’s MnO2 experiences are not this decade’s Polymer reality”,
2016 AEC Reliability Workshop
https://ec.kemet.com/polymer-capacitors-automotive-aec-reliability-workshop-2016
15 Years of Expanding Portfolio
Market Adoption
6© KEMET Electronics. All Rights Reserved.
ExistingPortfolio
Collaboration Project
GSTP5 Initiative
Space
Technological Innovations – High Reliability Performance
Terrestrial to Space
High Reliability Focus
7© KEMET Electronics. All Rights Reserved.
Design,
Materials and
Process
Screening
Methods
Technology Innovations Summary
8© KEMET Electronics. All Rights Reserved.
Major Degradation
Mechanisms in Tantalum
and Niobium-based
Capacitors
“The most typical reason for the
catastrophic failures of Ta capacitors at
normal operation conditions is growth of
crystalline inclusions in amorphous matrix
of their dielectric. This results in the
gradual increase of the mechanical stress
in the dielectric due to the difference in
density between the amorphous and
crystalline phases and eventually causes
the dielectric disruption and the capacitor
failure”.
T. Tripp and Y. Freeman
Commercial Process
TaC
Ta(O)
Hi-Rel Process
F-TECH
Design, Materials and Process - 1
9© KEMET Electronics. All Rights Reserved.
0
50
100
150
200
250
Powder De-lube Sintering
Carbon,ppm
Carbon in 50k CV/g Powder and Anodes
Liquid
Thermal
2Ta + 5O = Ta2O5 + Heat
Ta
TaC
1 2 3Carbon: Liquid De-lube
Significant Reduction (C ppm)
Oxygen: De-ox & Leaching
Ta(O)
Wire Welding
Ta(O) + Mg = Ta + MgO
Progressive Step Passivation
Intersticial Oxigen
Standard
Anode – wire
inserption and
sintering
Wire – weld
‘stronger’
mechanical
connection
Design, Materials and Process - 2
Key Factors: Chemical Purity & Mechanical Robustness
10© KEMET Electronics. All Rights Reserved.
CONDUCTIVE POLYMER BASED TANTALUM CAPACITOR FOR AUTOMOTIVE APPLICATION,
Jane Ye, Chris Stolarski, Mel Yuan and Cristina MotaCaetano, TIC 2015
Epoxy Permeability / Diffusion
Weak
Area
Weak
Area
Harsh Environmental Capability Improvement with EMC - C
Epoxy Permeability / Diffusion
Design, Materials and Process - 3
Key Factors: Epoxy Housing Protection / Low Permeability
11© KEMET Electronics. All Rights Reserved.
0.200.150.100.050.00
99.9
99
95
90
80
70
60
50
40
30
20
10
5
1
0.1
ESR at 100kHz (Ω)
Percent
PLIL
1000 Hrs ESR EMC-A
1000 Hrs ESR EMC-B
1000 Hrs ESR EMC-C
Variable
Probability Plot of ESR 85°C 85%RH at 0V
T521 EIA 7343-28 100µF 16V ESR 0.05Ω
Normal
Experiment
Design, Materials and Process – 4
Key Factors: Epoxy Housing Protection / Low Permeability
CONDUCTIVE POLYMER BASED TANTALUM CAPACITOR FOR AUTOMOTIVE APPLICATION,
Jane Ye, Chris Stolarski, Mel Yuan and Cristina MotaCaetano, TIC 2015
12© KEMET Electronics. All Rights Reserved.
R&D base on work of Dr Yuri Freeman, cover on US Patent
Screening Parameter
Percent
50403020100
99.9
99
95
90
80
70
60
50
40
30
20
10
5
1
0.1
Mean
<0.005
37.26
StDev 4.604
N 290
AD 66.448
P-Value
SCREENING
495X107K016 0646H128
good
parts
tail parts
Accelarated Life Test
good
parts
tail parts
Screening Methods
Simulated Break-Down Voltage (SBDS)
SBDS identifies most reliable parts in any given batch
13© KEMET Electronics. All Rights Reserved.
Low ESR
Benign Failure
Mode
‘New Reliability Assessment Practices for Tantalum Polymer Capacitors’; Dr. Erik Reed and Cristina Mota Caetano – ESTEC, Sep 2013
Screening Methods
Polymer Capacitor Reliability Assessment Test (PCRAT)
Weilbull Grading Alternative: PCRAT B, C, D reliability ratings available.
Advantages of Tantalum Polymer Capacitor Technology versus Tantalum MnO2
• How do you assure that shipped capacitors are good enough for Hi-Rel applications?
• How do you assign a failure rate to a lot?
• For MnO2 capacitors, we have lot-by-lot M55365 Weibull failure rate grading
• But Weibull grading is not always a good fit for Ta Polymer
14© KEMET Electronics. All Rights Reserved.
RoadMap
T583 ESA ESCC 3012/005 Extension to 50V – 1H_CY2018
T540/T541 High Reliability COTS
All spectrum with 85ºC/85%RH/Ur/1000h - 1H_CY2018
1st MIL- PRF for Ta Polymer SMD: T580/T581- 2H CY2018
15© KEMET Electronics. All Rights Reserved.
Slides and More information at:
https://ec.kemet.com/polymer-spacetech2017
Mission critical electronics High-performance
power management
Where failure is
not an option
Breakthrough technology Unparalleled borderless service Smart people
Innovative products that solve customer
challenges
Thank You!

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KO-CAP for High-Reliability Applications (Space Tech Expo 2017)

  • 1. 1© KEMET Electronics. All Rights Reserved. Hi-Rel KO-CAP®
  • 2. 2© KEMET Electronics. All Rights Reserved. Summarising Technology Innovations for Hi-Rel SMD Polymer Tantalum Capacitors Cristina Mota-Caetano 25th October 2017 Bremen Germany BOOTH #H90 ec.kemet.com/polymer-spacetech2017
  • 3. 3© KEMET Electronics. All Rights Reserved. 27 Manufacturing Plants* 15,000 Employees* 44 billion Components Shipped per year* Ship to 97 Countries Founded 1919 $ $1.1B* * Includes TOKIN
  • 4. 4© KEMET Electronics. All Rights Reserved. Outline • 15 Years Expanding Portfolio & Market Adoption • High Reliability Focus: From Terrestrial to Space • Technology Innovations Summary • RoadMap • Q&A
  • 5. 5© KEMET Electronics. All Rights Reserved. 2000 2015 Polymer (Growth Phase) MnO2 (Declining Phase) Consumer Enterprise Telecomm Military/Aero Space Automotive Sales Industrial Dot-com Bubble Polymer MnO2 Time 1999 Release 1987 Release Intersection Point (2015) Medical J. Young, “Last decade’s MnO2 experiences are not this decade’s Polymer reality”, 2016 AEC Reliability Workshop https://ec.kemet.com/polymer-capacitors-automotive-aec-reliability-workshop-2016 15 Years of Expanding Portfolio Market Adoption
  • 6. 6© KEMET Electronics. All Rights Reserved. ExistingPortfolio Collaboration Project GSTP5 Initiative Space Technological Innovations – High Reliability Performance Terrestrial to Space High Reliability Focus
  • 7. 7© KEMET Electronics. All Rights Reserved. Design, Materials and Process Screening Methods Technology Innovations Summary
  • 8. 8© KEMET Electronics. All Rights Reserved. Major Degradation Mechanisms in Tantalum and Niobium-based Capacitors “The most typical reason for the catastrophic failures of Ta capacitors at normal operation conditions is growth of crystalline inclusions in amorphous matrix of their dielectric. This results in the gradual increase of the mechanical stress in the dielectric due to the difference in density between the amorphous and crystalline phases and eventually causes the dielectric disruption and the capacitor failure”. T. Tripp and Y. Freeman Commercial Process TaC Ta(O) Hi-Rel Process F-TECH Design, Materials and Process - 1
  • 9. 9© KEMET Electronics. All Rights Reserved. 0 50 100 150 200 250 Powder De-lube Sintering Carbon,ppm Carbon in 50k CV/g Powder and Anodes Liquid Thermal 2Ta + 5O = Ta2O5 + Heat Ta TaC 1 2 3Carbon: Liquid De-lube Significant Reduction (C ppm) Oxygen: De-ox & Leaching Ta(O) Wire Welding Ta(O) + Mg = Ta + MgO Progressive Step Passivation Intersticial Oxigen Standard Anode – wire inserption and sintering Wire – weld ‘stronger’ mechanical connection Design, Materials and Process - 2 Key Factors: Chemical Purity & Mechanical Robustness
  • 10. 10© KEMET Electronics. All Rights Reserved. CONDUCTIVE POLYMER BASED TANTALUM CAPACITOR FOR AUTOMOTIVE APPLICATION, Jane Ye, Chris Stolarski, Mel Yuan and Cristina MotaCaetano, TIC 2015 Epoxy Permeability / Diffusion Weak Area Weak Area Harsh Environmental Capability Improvement with EMC - C Epoxy Permeability / Diffusion Design, Materials and Process - 3 Key Factors: Epoxy Housing Protection / Low Permeability
  • 11. 11© KEMET Electronics. All Rights Reserved. 0.200.150.100.050.00 99.9 99 95 90 80 70 60 50 40 30 20 10 5 1 0.1 ESR at 100kHz (Ω) Percent PLIL 1000 Hrs ESR EMC-A 1000 Hrs ESR EMC-B 1000 Hrs ESR EMC-C Variable Probability Plot of ESR 85°C 85%RH at 0V T521 EIA 7343-28 100µF 16V ESR 0.05Ω Normal Experiment Design, Materials and Process – 4 Key Factors: Epoxy Housing Protection / Low Permeability CONDUCTIVE POLYMER BASED TANTALUM CAPACITOR FOR AUTOMOTIVE APPLICATION, Jane Ye, Chris Stolarski, Mel Yuan and Cristina MotaCaetano, TIC 2015
  • 12. 12© KEMET Electronics. All Rights Reserved. R&D base on work of Dr Yuri Freeman, cover on US Patent Screening Parameter Percent 50403020100 99.9 99 95 90 80 70 60 50 40 30 20 10 5 1 0.1 Mean <0.005 37.26 StDev 4.604 N 290 AD 66.448 P-Value SCREENING 495X107K016 0646H128 good parts tail parts Accelarated Life Test good parts tail parts Screening Methods Simulated Break-Down Voltage (SBDS) SBDS identifies most reliable parts in any given batch
  • 13. 13© KEMET Electronics. All Rights Reserved. Low ESR Benign Failure Mode ‘New Reliability Assessment Practices for Tantalum Polymer Capacitors’; Dr. Erik Reed and Cristina Mota Caetano – ESTEC, Sep 2013 Screening Methods Polymer Capacitor Reliability Assessment Test (PCRAT) Weilbull Grading Alternative: PCRAT B, C, D reliability ratings available. Advantages of Tantalum Polymer Capacitor Technology versus Tantalum MnO2 • How do you assure that shipped capacitors are good enough for Hi-Rel applications? • How do you assign a failure rate to a lot? • For MnO2 capacitors, we have lot-by-lot M55365 Weibull failure rate grading • But Weibull grading is not always a good fit for Ta Polymer
  • 14. 14© KEMET Electronics. All Rights Reserved. RoadMap T583 ESA ESCC 3012/005 Extension to 50V – 1H_CY2018 T540/T541 High Reliability COTS All spectrum with 85ºC/85%RH/Ur/1000h - 1H_CY2018 1st MIL- PRF for Ta Polymer SMD: T580/T581- 2H CY2018
  • 15. 15© KEMET Electronics. All Rights Reserved. Slides and More information at: https://ec.kemet.com/polymer-spacetech2017
  • 16. Mission critical electronics High-performance power management Where failure is not an option Breakthrough technology Unparalleled borderless service Smart people Innovative products that solve customer challenges Thank You!