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Course Name:VLSI Circuit Design
Course Code: AET 402
Credits:3
MODULE 1 &2
VLSI Circuit Design
SYLLABUS
 Module 1: Overview of CMOS device fundamentals (Pre-
requisite). The CMOS inverter: - Voltage Transfer
Characteristics, SPICE Description, Static Behavior - Switching
Threshold - Noise Margins, Dynamic behavior - Device
Capacitances - Propagation Delay - Power Consumption.
 Module 2: CMOS fabrication Processes: -N-Tub, P-Tub and
Twin Tub. MOS Circuit Layout - Stick diagrams, Layout design
rules, Transistor layout - PMOS and NMOS, Gate Layout -
Inverter, NAND, NOR and XOR, Layout generation using
MICROWIND tool (For Assignments/Projects only).
Overview of CMOS device
fundamentals (Pre-requisite)
 Integrated circuits: many transistors on one
chip.
 Very Large Scale Integration (VLSI)
 Complementary Metal Oxide Semiconductor
(CMOS)
 Fast, cheap, “low-power” transistors circuits
WHY VLSI DESIGN?
Money, technology, civilization
Digression: Silicon Semiconductors
 Modern electronic chips are built mostly on silicon substrates
 Silicon is a Group IV semiconducting material
 crystal lattice: covalent bonds hold each atom to four neighbors
Si Si
Si
Si Si
Si
Si Si
Si
http://onlineheavytheory.net/silicon.html
Dopants
 Silicon is a semiconductor at room temperature
 Pure silicon has few free carriers and conducts poorly
 Adding dopants increases the conductivity drastically
 Dopant from Group V (e.g. As, P): extra electron (n-
type)
 Dopant from Group III (e.g. B, Al): missing electron,
called hole (p-type)
As Si
Si
Si Si
Si
Si Si
Si
B Si
Si
Si Si
Si
Si Si
Si
-
+
+
-
p-n Junctions
 First semiconductor (two terminal) devices
 A junction between p-type and n-type
semiconductor forms a diode.
 Current flows only in one direction
p-type n-type
anode cathode
A Brief History
Invention of the Transistor
 Vacuum tubes ruled in first half of 20th
century Large,
expensive, power-hungry, unreliable
 1947: first point contact transistor (3 terminal devices)
 Shockley, Bardeen and Brattain at Bell Labs
A Brief History, contd..
 1958: First integrated circuit
 Flip-flop using two transistors
 Built by Jack Kilby (Nobel Laureate) at Texas Instruments
 Robert Noyce (Fairchild) is also considered as a co-inventor
smithsonianchips.si.edu/ augarten/
Kilby’s IC
A Brief History, contd.
 First Planer IC built in 1961
 2003
 Intel Pentium 4 processor (55 million transistors)
 512 Mbit DRAM (> 0.5 billion transistors)
 53% compound annual growth rate over 45 years
 No other technology has grown so fast so long
 Driven by miniaturization of transistors
 Smaller is cheaper, faster, lower in power!
 Revolutionary effects on society
 1970’s processes usually had only nMOS transistors
Inexpensive, but consume power while idle
 1980s-present: CMOS processes for low idle power
MOS Integrated Circuits
Intel 1101 256-bit SRAM Intel 4004 4-bit Proc
Moore’s Law
 1965: Gordon Moore plotted transistor on each chip
 Fit straight line on semilog scale
 Transistor counts have doubled every 26 months
Year
Transistors
4004
8008
8080
8086
80286
Intel386
Intel486
Pentium
Pentium Pro
Pentium II
Pentium III
Pentium 4
1,000
10,000
100,000
1,000,000
10,000,000
100,000,000
1,000,000,000
1970 1975 1980 1985 1990 1995 2000
Integration Levels
SSI: 10 gates
MSI: 1000 gates
LSI: 10,000 gates
VLSI: > 10k gates
http://www.intel.com/technology/silicon/mooreslaw/
Corollaries
 Many other factors grow exponentially
 Ex: clock frequency, processor performance
Year
1
10
100
1,000
10,000
1970 1975 1980 1985 1990 1995 2000 2005
4004
8008
8080
8086
80286
Intel386
Intel486
Pentium
Pentium Pro/II/III
Pentium 4
Clock
Speed
(MHz)
Pentium 4 Processor
http://www.intel.com/intel/intelis/museum/online/hist_micro/hof/index.htm
Ref: http://micro.magnet.fsu.edu/creatures/technical/sizematters.html
• Modern transistors are few microns wide and approximately
0.1 micron or less in length
• Human hair is 80-90 microns in diameter
Transistor Types
 Bipolar transistors
 npn or pnp silicon structure
 Small current into very thin base layer controls large
currents between emitter and collector
 Base currents limit integration density
 Metal Oxide Semiconductor Field Effect Transistors
 nMOS and pMOS MOSFETS
 Voltage applied to insulated gate controls current
between source and drain
 Low power allows very high integration
 First patent in the ’20s in USA and Germany
 Not widely used until the ’60s or ’70s
MOS Transistors
 Four terminal device: gate, source, drain, body
 Gate – oxide – body stack looks like a capacitor
 Gate and body are conductors (body is also called the substrate)
 SiO2 (oxide) is a “good” insulator (separates the gate from the body
 Called metal–oxide–semiconductor (MOS) capacitor, even though
gate is mostly made of poly-crystalline silicon (polysilicon)
n+
p
Gate
Source Drain
bulk Si
SiO2
Polysilicon
n+
SiO2
n
Gate
Source Drain
bulk Si
Polysilicon
p+ p+
NMOS PMOS
NMOS Operation
 Body is commonly tied to ground (0 V)
 Drain is at a higher voltage than Source
 When the gate is at a low voltage:
 P-type body is at low voltage
 Source-body and drain-body “diodes” are OFF
 No current flows, transistor is OFF
n+
p
Gate
Source Drain
bulk Si
SiO2
Polysilicon
n+
D
0
S
NMOS Operation Cont.
 When the gate is at a high voltage: Positive charge
on gate of MOS capacitor
 Negative charge is attracted to body under the gate
 Inverts a channel under gate to “n-type” (N-channel, hence
called the NMOS) if the gate voltage is above a threshold
voltage (VT)
 Now current can flow through “n-type” silicon from source
through channel to drain, transistor is ON
n+
p
Gate
Source Drain
bulk Si
SiO2
Polysilicon
n+
D
1
S
PMOS Transistor
 Similar, but doping and voltages reversed
 Body tied to high voltage (VDD)
 Drain is at a lower voltage than the Source
 Gate low: transistor ON
 Gate high: transistor OFF
 Bubble indicates inverted behavior
SiO2
n
Gate
Source Drain
bulk Si
Polysilicon
p+ p+
Power Supply Voltage
 GND = 0 V
 In 1980’s, VDD = 5V
 VDD has decreased in modern processes
 High VDD would damage modern tiny transistors
 Lower VDD saves power
 VDD = 3.3, 2.5, 1.8, 1.5, 1.2, 1.0,
 Effective power supply voltage can be lower due
to IR drop across the power grid.
Transistors as Switches
 In Digital circuits, MOS transistors are
electrically controlled switches
 Voltage at gate controls path from source to
drain
g
s
d
g = 0
s
d
g = 1
s
d
g
s
d
s
d
s
d
nMOS
pMOS
OFF
ON
ON
OFF
The CMOS Inverter
1
0
Y
A VDD
A Y
GND
A Y
CMOS Inverter
0
1
0
Y
A VDD
A=1 Y=0
GND
ON
OFF
A Y
Y is pulled low by the
turned on NMOS
Device. Hence NMOS
is the pull-down
device.
CMOS Inverter
0
1
1
0
Y
A VDD
A=0 Y=1
GND
OFF
ON
A Y
Y is pulled high by
the turned on PMOS
Device. Hence PMOS
is the pull-up device.
CMOS NAND Gate
1
1
0
0
A
1
0
1
0
Y
B
A
B
Y
CMOS NAND Gate
1
1
0
0
A
1
0
1
1
0
Y
B
A=0
B=0
Y=1
OFF
ON ON
OFF
CMOS NAND Gate
1
1
0
0
A
1
1
0
1
1
0
Y
B
A=0
B=1
Y=1
OFF
OFF ON
ON
CMOS NAND Gate
1
1
0
0
A
1
1
1
0
1
1
0
Y
B
A=1
B=0
Y=1
ON
ON OFF
OFF
CMOS NAND Gate
1
1
0
0
A
1
1
1
0
0
1
1
0
Y
B
A=1
B=1
Y=0
ON
OFF OFF
ON
CMOS NOR Gate
1
1
0
0
A
0
1
0
0
0
1
1
0
Y
B
A
B
Y
3-input NAND Gate
 Y is pulled low if ALL inputs are 1
 Y is pulled high if ANY input is 0
A
B
Y
C
CMOS Fabrication
 CMOS transistors are fabricated on silicon
wafer
 Wafers diameters (200-300 mm)
 Lithography process similar to printing press
 On each step, different materials are
deposited, or patterned or etched
 Easiest to understand by viewing both top
and cross-section of wafer in a simplified
manufacturing process
The CMOS inverter: - Voltage
Transfer Characteristics,
Voltage Transfer Characteristics,
Voltage Transfer Characteristics,
Region-1
In this region the input is in the range of (0,Vtn).
Since the input voltage is less than Vtn, the NMOS
is in cutoff region. No current flows from Vdd to
Vss, The entire Vdd will appear at the Output
terminal.
NMOS is in cutoff as Vgs < Vtn
PMOS is in linear as Vgsp < Vtp and Vdsp > Vgsp
-Vtp.
Zero current flows from supply voltage and the
power dissipation is zero.
Region-2
In this region the input is in the range of
(Vtn,Vdd/2). Since the input voltage is greater than
Vtn the NMOS is conducting and it jumps to
saturation as it has large Vds across it(Vout is
high). PMOS still remains in the linear region.
NMOS is in saturation as Vgs > Vtn and Vout >Vin
- Vtn.
PMOS is in linear region as Vdsp > Vgsp -Vtp.
since both the transistors are conducting some
amount of current flows from supply in this region.
Voltage Transfer Characteristics,
Region-3
In this region the input voltage is Vdd/2. At this point
the output voltage is also Vdd/2 as one can see in
figure-2. At this voltage both the NMOS and PMOS
are in saturation and the output drops drastically from
Vdd to Vdd/2. At this point a large amount of current
flows from the supply. Most of the power consumed in
CMOS inverter is at this point. So care should be
taken that the Input should not stay at Vdd/2 for more
amount of time.
NMOS is in saturation as Vgs > Vtn and Vout >Vin -
Vtn.
PMOS is in saturation as Vgsp < Vtp and Vdsp < Vgsp
-Vtp.
Large amount of current is drawn from supply and
hence large power dissipation.
Region-4
In this region the input voltage is in the
range of (Vdd/2 , Vdd-Vtp). Here the
PMOS remains in saturation as Vout < Vin
- Vtp and Vgsp < Vtp. But the NMOS
moves from saturation to linear region
since the drain to source voltage now is
less than Vgsn-Vtn.
NMOS is in linear as Vgs > Vtn and Vout <
Vin - Vtn.
PMOS is in saturation as Vgsp < Vtp and
Vdsp < Vgsp -Vtp.
A medium amount of current is drawn as
NMOS is in linear region and power
dissipation is low.
Voltage Transfer Characteristics,
Voltage Transfer Characteristics,
Region-5
In this region the input voltage is in the range of
(Vdd-Vtp,Vdd). Here the PMOS moves from
saturation to cutoff as the Vgsp is so high that
Vgsp > Vtp. The NMOS still remains in linear as
the drain to source voltage now is less than
Vgsn-Vtn.
NMOS is in linear as Vgs > Vtn and Vout < Vin -
Vtn.
PMOS is in cutoff as Vgsp > Vtp.
Zero current flows from the supply and so the
power dissipation is zero.
Now that we have clearly understood the voltage
transfer characteristics and operation of an
NMOS, we will discuss how to alter the transfer
characteristics of any CMOS gate in the next
article.
Static Behavior of CMOS inverter
Static Behavior of CMOS inverter
Switching Threshold
Switching Threshold
Switching Threshold
Switching Threshold
Reminder: Noise Margin
Noise Margin
Noise Margin
aet 402 lecture1.ppt vlsi CIRCUIT DESIGN
The CMOS Inverter-Dynamic
Behavior
 Device capacitance
 Propagation Delay
 Power Consumption
Device Capacitance
Device Capacitance
Device Capacitance
Device Capacitance
Propagation Delay
Propagation Delay-Solving the
integral
Propagation Delay-Solving the
integral
Propagation Delay-Solving the
integral
Propagation Delay-Solving the
integral
Propagation Delay-Average
currents
Propagation Delay-Average
currents
Propagation Delay-Average
currents
Propagation Delay-Equivalent
Resistance
Propagation Delay-Equivalent
Resistance
Propagation Delay-Equivalent
Resistance
Propagation Delay-Equivalent
Resistance
Propagation Delay-Equivalent
Resistance
Affect of Device Sizing
Device Sizing
aet 402 lecture1.ppt vlsi CIRCUIT DESIGN
aet 402 lecture1.ppt vlsi CIRCUIT DESIGN
aet 402 lecture1.ppt vlsi CIRCUIT DESIGN
aet 402 lecture1.ppt vlsi CIRCUIT DESIGN
aet 402 lecture1.ppt vlsi CIRCUIT DESIGN
aet 402 lecture1.ppt vlsi CIRCUIT DESIGN
aet 402 lecture1.ppt vlsi CIRCUIT DESIGN
aet 402 lecture1.ppt vlsi CIRCUIT DESIGN
aet 402 lecture1.ppt vlsi CIRCUIT DESIGN
Power Consumption
aet 402 lecture1.ppt vlsi CIRCUIT DESIGN

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aet 402 lecture1.ppt vlsi CIRCUIT DESIGN

  • 1. Course Name:VLSI Circuit Design Course Code: AET 402 Credits:3 MODULE 1 &2
  • 3. SYLLABUS  Module 1: Overview of CMOS device fundamentals (Pre- requisite). The CMOS inverter: - Voltage Transfer Characteristics, SPICE Description, Static Behavior - Switching Threshold - Noise Margins, Dynamic behavior - Device Capacitances - Propagation Delay - Power Consumption.  Module 2: CMOS fabrication Processes: -N-Tub, P-Tub and Twin Tub. MOS Circuit Layout - Stick diagrams, Layout design rules, Transistor layout - PMOS and NMOS, Gate Layout - Inverter, NAND, NOR and XOR, Layout generation using MICROWIND tool (For Assignments/Projects only).
  • 4. Overview of CMOS device fundamentals (Pre-requisite)  Integrated circuits: many transistors on one chip.  Very Large Scale Integration (VLSI)  Complementary Metal Oxide Semiconductor (CMOS)  Fast, cheap, “low-power” transistors circuits
  • 5. WHY VLSI DESIGN? Money, technology, civilization
  • 6. Digression: Silicon Semiconductors  Modern electronic chips are built mostly on silicon substrates  Silicon is a Group IV semiconducting material  crystal lattice: covalent bonds hold each atom to four neighbors Si Si Si Si Si Si Si Si Si http://onlineheavytheory.net/silicon.html
  • 7. Dopants  Silicon is a semiconductor at room temperature  Pure silicon has few free carriers and conducts poorly  Adding dopants increases the conductivity drastically  Dopant from Group V (e.g. As, P): extra electron (n- type)  Dopant from Group III (e.g. B, Al): missing electron, called hole (p-type) As Si Si Si Si Si Si Si Si B Si Si Si Si Si Si Si Si - + + -
  • 8. p-n Junctions  First semiconductor (two terminal) devices  A junction between p-type and n-type semiconductor forms a diode.  Current flows only in one direction p-type n-type anode cathode
  • 9. A Brief History Invention of the Transistor  Vacuum tubes ruled in first half of 20th century Large, expensive, power-hungry, unreliable  1947: first point contact transistor (3 terminal devices)  Shockley, Bardeen and Brattain at Bell Labs
  • 10. A Brief History, contd..  1958: First integrated circuit  Flip-flop using two transistors  Built by Jack Kilby (Nobel Laureate) at Texas Instruments  Robert Noyce (Fairchild) is also considered as a co-inventor smithsonianchips.si.edu/ augarten/ Kilby’s IC
  • 11. A Brief History, contd.  First Planer IC built in 1961  2003  Intel Pentium 4 processor (55 million transistors)  512 Mbit DRAM (> 0.5 billion transistors)  53% compound annual growth rate over 45 years  No other technology has grown so fast so long  Driven by miniaturization of transistors  Smaller is cheaper, faster, lower in power!  Revolutionary effects on society
  • 12.  1970’s processes usually had only nMOS transistors Inexpensive, but consume power while idle  1980s-present: CMOS processes for low idle power MOS Integrated Circuits Intel 1101 256-bit SRAM Intel 4004 4-bit Proc
  • 13. Moore’s Law  1965: Gordon Moore plotted transistor on each chip  Fit straight line on semilog scale  Transistor counts have doubled every 26 months Year Transistors 4004 8008 8080 8086 80286 Intel386 Intel486 Pentium Pentium Pro Pentium II Pentium III Pentium 4 1,000 10,000 100,000 1,000,000 10,000,000 100,000,000 1,000,000,000 1970 1975 1980 1985 1990 1995 2000 Integration Levels SSI: 10 gates MSI: 1000 gates LSI: 10,000 gates VLSI: > 10k gates http://www.intel.com/technology/silicon/mooreslaw/
  • 14. Corollaries  Many other factors grow exponentially  Ex: clock frequency, processor performance Year 1 10 100 1,000 10,000 1970 1975 1980 1985 1990 1995 2000 2005 4004 8008 8080 8086 80286 Intel386 Intel486 Pentium Pentium Pro/II/III Pentium 4 Clock Speed (MHz)
  • 16. Ref: http://micro.magnet.fsu.edu/creatures/technical/sizematters.html • Modern transistors are few microns wide and approximately 0.1 micron or less in length • Human hair is 80-90 microns in diameter
  • 17. Transistor Types  Bipolar transistors  npn or pnp silicon structure  Small current into very thin base layer controls large currents between emitter and collector  Base currents limit integration density  Metal Oxide Semiconductor Field Effect Transistors  nMOS and pMOS MOSFETS  Voltage applied to insulated gate controls current between source and drain  Low power allows very high integration  First patent in the ’20s in USA and Germany  Not widely used until the ’60s or ’70s
  • 18. MOS Transistors  Four terminal device: gate, source, drain, body  Gate – oxide – body stack looks like a capacitor  Gate and body are conductors (body is also called the substrate)  SiO2 (oxide) is a “good” insulator (separates the gate from the body  Called metal–oxide–semiconductor (MOS) capacitor, even though gate is mostly made of poly-crystalline silicon (polysilicon) n+ p Gate Source Drain bulk Si SiO2 Polysilicon n+ SiO2 n Gate Source Drain bulk Si Polysilicon p+ p+ NMOS PMOS
  • 19. NMOS Operation  Body is commonly tied to ground (0 V)  Drain is at a higher voltage than Source  When the gate is at a low voltage:  P-type body is at low voltage  Source-body and drain-body “diodes” are OFF  No current flows, transistor is OFF n+ p Gate Source Drain bulk Si SiO2 Polysilicon n+ D 0 S
  • 20. NMOS Operation Cont.  When the gate is at a high voltage: Positive charge on gate of MOS capacitor  Negative charge is attracted to body under the gate  Inverts a channel under gate to “n-type” (N-channel, hence called the NMOS) if the gate voltage is above a threshold voltage (VT)  Now current can flow through “n-type” silicon from source through channel to drain, transistor is ON n+ p Gate Source Drain bulk Si SiO2 Polysilicon n+ D 1 S
  • 21. PMOS Transistor  Similar, but doping and voltages reversed  Body tied to high voltage (VDD)  Drain is at a lower voltage than the Source  Gate low: transistor ON  Gate high: transistor OFF  Bubble indicates inverted behavior SiO2 n Gate Source Drain bulk Si Polysilicon p+ p+
  • 22. Power Supply Voltage  GND = 0 V  In 1980’s, VDD = 5V  VDD has decreased in modern processes  High VDD would damage modern tiny transistors  Lower VDD saves power  VDD = 3.3, 2.5, 1.8, 1.5, 1.2, 1.0,  Effective power supply voltage can be lower due to IR drop across the power grid.
  • 23. Transistors as Switches  In Digital circuits, MOS transistors are electrically controlled switches  Voltage at gate controls path from source to drain g s d g = 0 s d g = 1 s d g s d s d s d nMOS pMOS OFF ON ON OFF
  • 24. The CMOS Inverter 1 0 Y A VDD A Y GND A Y
  • 25. CMOS Inverter 0 1 0 Y A VDD A=1 Y=0 GND ON OFF A Y Y is pulled low by the turned on NMOS Device. Hence NMOS is the pull-down device.
  • 26. CMOS Inverter 0 1 1 0 Y A VDD A=0 Y=1 GND OFF ON A Y Y is pulled high by the turned on PMOS Device. Hence PMOS is the pull-up device.
  • 33. 3-input NAND Gate  Y is pulled low if ALL inputs are 1  Y is pulled high if ANY input is 0 A B Y C
  • 34. CMOS Fabrication  CMOS transistors are fabricated on silicon wafer  Wafers diameters (200-300 mm)  Lithography process similar to printing press  On each step, different materials are deposited, or patterned or etched  Easiest to understand by viewing both top and cross-section of wafer in a simplified manufacturing process
  • 35. The CMOS inverter: - Voltage Transfer Characteristics,
  • 37. Voltage Transfer Characteristics, Region-1 In this region the input is in the range of (0,Vtn). Since the input voltage is less than Vtn, the NMOS is in cutoff region. No current flows from Vdd to Vss, The entire Vdd will appear at the Output terminal. NMOS is in cutoff as Vgs < Vtn PMOS is in linear as Vgsp < Vtp and Vdsp > Vgsp -Vtp. Zero current flows from supply voltage and the power dissipation is zero. Region-2 In this region the input is in the range of (Vtn,Vdd/2). Since the input voltage is greater than Vtn the NMOS is conducting and it jumps to saturation as it has large Vds across it(Vout is high). PMOS still remains in the linear region. NMOS is in saturation as Vgs > Vtn and Vout >Vin - Vtn. PMOS is in linear region as Vdsp > Vgsp -Vtp. since both the transistors are conducting some amount of current flows from supply in this region.
  • 38. Voltage Transfer Characteristics, Region-3 In this region the input voltage is Vdd/2. At this point the output voltage is also Vdd/2 as one can see in figure-2. At this voltage both the NMOS and PMOS are in saturation and the output drops drastically from Vdd to Vdd/2. At this point a large amount of current flows from the supply. Most of the power consumed in CMOS inverter is at this point. So care should be taken that the Input should not stay at Vdd/2 for more amount of time. NMOS is in saturation as Vgs > Vtn and Vout >Vin - Vtn. PMOS is in saturation as Vgsp < Vtp and Vdsp < Vgsp -Vtp. Large amount of current is drawn from supply and hence large power dissipation.
  • 39. Region-4 In this region the input voltage is in the range of (Vdd/2 , Vdd-Vtp). Here the PMOS remains in saturation as Vout < Vin - Vtp and Vgsp < Vtp. But the NMOS moves from saturation to linear region since the drain to source voltage now is less than Vgsn-Vtn. NMOS is in linear as Vgs > Vtn and Vout < Vin - Vtn. PMOS is in saturation as Vgsp < Vtp and Vdsp < Vgsp -Vtp. A medium amount of current is drawn as NMOS is in linear region and power dissipation is low. Voltage Transfer Characteristics,
  • 40. Voltage Transfer Characteristics, Region-5 In this region the input voltage is in the range of (Vdd-Vtp,Vdd). Here the PMOS moves from saturation to cutoff as the Vgsp is so high that Vgsp > Vtp. The NMOS still remains in linear as the drain to source voltage now is less than Vgsn-Vtn. NMOS is in linear as Vgs > Vtn and Vout < Vin - Vtn. PMOS is in cutoff as Vgsp > Vtp. Zero current flows from the supply and so the power dissipation is zero. Now that we have clearly understood the voltage transfer characteristics and operation of an NMOS, we will discuss how to alter the transfer characteristics of any CMOS gate in the next article.
  • 41. Static Behavior of CMOS inverter
  • 42. Static Behavior of CMOS inverter
  • 51. The CMOS Inverter-Dynamic Behavior  Device capacitance  Propagation Delay  Power Consumption