Data Converters Design And Testing

The document presents a research presentation on IDDQ testing methodologies for CMOS data converters by Siva Yellampalli, addressing the need for testing due to physical faults and various fault injection techniques. It outlines methodologies such as IDDQ, IDDT, and oscillation testing while discussing the potential future trends and challenges in defect detection. The presentation also includes details on data converter circuits and provides experimental results related to fault injection in these devices.