This document proposes algorithms to efficiently find the best parameter K for the emerging pattern-based classifier PCL. It first summarizes the PCL classifier and discusses how the parameter K impacts its performance. It then presents the rPCL and ePCL algorithms. rPCL repeatedly runs cross-validation to determine the best K by averaging accuracies. ePCL enhances rPCL by using an incremental pattern maintenance technique to avoid repeatedly constructing emerging patterns from scratch, improving efficiency. Experimental results show ePCL finds the best K much faster than rPCL by leveraging pattern maintenance.