This document presents a method for fabric defect detection using wavelet transforms and genetic algorithms. Wavelet transforms are used to extract coefficients from sample fabric images, and a genetic algorithm selects an optimal subset of coefficients that best identify defects. Two separate coefficient sets are determined, one for horizontal defects and one for vertical defects, to improve accuracy. Experimental results on two fabric image databases demonstrate that the technique can effectively detect various defect types and configurations after applying thresholding and denoising post-processing steps to the wavelet-filtered images.