AtomicJ
Application for analysis of AFM data
AtomicJ is an application for analysis of force microscopy recordings, including images and force curves. It allows for fast and reliable processing of single force curves and force maps, providing estimation of the mechanical properties of the sample. AtomicJ supports a wide range of contact mechanics models, including the models for blunt tips, the corrections for the effect of finite sample thickness, models of adhesive contact and models of spherical indentation of hyperelastic material. ...